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Eberhart, Jean Pierre,

Structural and chemical analysis of materials : X-ray, electron and neutron diffraction : X-ray, electron and ion spectrometry : Electron microscopy / J. p. eberhart ; translated by j. p. eberhart - 545 páginas

ISBN: 0471929778

Subjects--Topical Terms:
Materiales--Microscopía
Microestructura

LC Class. No.: TA417.23 / E34