Eberhart, Jean Pierre, <br/><br/>
Structural and chemical analysis of materials :  X-ray, electron and neutron diffraction :  X-ray, electron and ion spectrometry :  Electron microscopy / 
J. p. eberhart ; translated by j. p. eberhart 
 - 545 páginas 
<br/><br/><label>ISBN: </label>0471929778 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materiales--Microscopía<br/>Microestructura
<br/><br/><label>LC Class. No.: </label>TA417.23  / E34