TY  - BOOK
AU  - Eberhart, Jean Pierre,
TI  - Structural and chemical analysis of materials: X-ray, electron and neutron diffraction 
SN  - 0471929778
AV  - TA417.23 E34
PY  - 1991///
CY  - Chichester
PB  - J. Wiley
KW  - Materiales
KW  - Microscopía
KW  - Microestructura
ER  -