000 | 01239nam a2200313zi 4500 | ||
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005 | 20200314100447.0 | ||
008 | 021004s2001 ne a b 100 0 eng | ||
020 | _a1586031678 (IOS Press) | ||
020 | _a4-274-90456-3 (Ohmsha) | ||
035 | _aMX001000932817 | ||
040 |
_aDLC _cDLC |
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041 | _aENG | ||
050 | 4 |
_aQC81 _bI57 |
|
111 | 2 |
_aInternational School of Physics "Enrico Fermi" _d(2000 : _cVarenna, Italia) |
|
245 | 1 | 0 |
_aRecent advances in metrology and fundamental constants : _bVarenna on Lake Como, Villa Monastero, 25 July-4 August 2000 / _cedited by T.J. Quinn and S. Leschiutta and by P. Tavella |
246 | 3 | 0 | _aMetrologia e constanti fondamentali: recenti sviluppi |
264 | 1 |
_aAmsterdam : _bIOS, _[2001] |
|
300 |
_axxii, 827 páginas : _bilustraciones |
||
490 | 0 |
_aProceedings of the International School of Physics "Enrico Fermi", _x0074-784X ; _vcourse 146 |
|
650 | 4 |
_aMetrologia _vCongresos |
|
650 | 4 |
_aConstantes físicas _vCongresos |
|
700 | 1 |
_aQuinn, Terry J., _eeditor |
|
700 | 1 |
_aLeschiutta, Sigfrido, _eeditor |
|
700 | 1 |
_aTavella, Patrizia, _eeditor |
|
336 |
_atexto _2rdacontent |
||
337 |
_asin medio _2rdamedia |
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338 |
_avolumen _2rdacarrier |
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999 |
_c10787 _d10787 |