000 01239nam a2200313zi 4500
005 20200314100447.0
008 021004s2001 ne a b 100 0 eng
020 _a1586031678 (IOS Press)
020 _a4-274-90456-3 (Ohmsha)
035 _aMX001000932817
040 _aDLC
_cDLC
041 _aENG
050 4 _aQC81
_bI57
111 2 _aInternational School of Physics "Enrico Fermi"
_d(2000 :
_cVarenna, Italia)
245 1 0 _aRecent advances in metrology and fundamental constants :
_bVarenna on Lake Como, Villa Monastero, 25 July-4 August 2000 /
_cedited by T.J. Quinn and S. Leschiutta and by P. Tavella
246 3 0 _aMetrologia e constanti fondamentali: recenti sviluppi
264 1 _aAmsterdam :
_bIOS,
_[2001]
300 _axxii, 827 páginas :
_bilustraciones
490 0 _aProceedings of the International School of Physics "Enrico Fermi",
_x0074-784X ;
_vcourse 146
650 4 _aMetrologia
_vCongresos
650 4 _aConstantes físicas
_vCongresos
700 1 _aQuinn, Terry J.,
_eeditor
700 1 _aLeschiutta, Sigfrido,
_eeditor
700 1 _aTavella, Patrizia,
_eeditor
336 _atexto
_2rdacontent
337 _asin medio
_2rdamedia
338 _avolumen
_2rdacarrier
999 _c10787
_d10787