| 000 | 00757nam a2200241zi 4500 | ||
|---|---|---|---|
| 005 | 20200314100346.0 | ||
| 008 | 970106s1986 000 0 eng | ||
| 020 | _a082477583x | ||
| 035 | _aMX001000527335 | ||
| 050 |
_aQD63.R4 _bJ65 |
||
| 100 | 0 |
_aJones, Alan, _eautor |
|
| 245 | 1 | 0 |
_aTemperature-programmed reduction for solid materials characterization / _cAlan Jones, Brian mcnicol |
| 264 | 1 |
_aNew York : _bM. Dekker, _cc1986 |
|
| 300 | _a199 páginas | ||
| 490 | 0 |
_aChemical industries ; _vv. 24 |
|
| 650 | _aReducción (Química) | ||
| 650 |
_aMateriales _xQuímica |
||
| 700 |
_aMcnicol, Brian _eautor |
||
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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| 999 |
_c5465 _d5465 |
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