| 000 | 00878nam a2200241zi 4500 | ||
|---|---|---|---|
| 005 | 20200314100410.0 | ||
| 008 | 040830s1992 000 0 eng | ||
| 020 | _a0750691689 | ||
| 035 | _aMX001000638651 | ||
| 050 |
_aTA418.7 _bB47 |
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| 245 | 0 | 0 |
_aEncyclopedia of materials characterization : _bSurfaces, interfaces, thin films / _cEds. c. Richard brundle, Charles a. Evans, jr., shaun Wilson ; managing ed. Lee e. fitzpatrick |
| 264 | 1 |
_aBoston : _bButterworth-Heinemann, _cc1992 |
|
| 300 | _axix, 751 páginas | ||
| 490 | 0 | _aMaterials characterization series | |
| 650 |
_aSuperficies (Tecnología) _xPruebas |
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| 700 |
_aBrundle, C. R., _eeditor |
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| 700 |
_aEvans, Charles A., _eeditor |
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| 700 |
_aWilson, Shaun _eeditor |
||
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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| 999 |
_c7536 _d7536 |
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