Modern surface analysis : metallurgical applications of auger electron spectroscopy (aes) and x-ray photo electron spectroscopy (xps), las Vegas, Nevada, february 23-24, 1980 /L. E. Davis 1980 /
edited by Ram Kossowsky and M. E. Glicksman
- 42 páginas
A la cabeza de la portada: "a tms-aime short course" Curso auspiciado por "the tms-aime continuing education committee"