| 000 | 01415nam a2200301zi 4500 | ||
|---|---|---|---|
| 005 | 20200318103731.0 | ||
| 008 | 970106s1988 xxu 100 0 eng | ||
| 020 | _a030643086x | ||
| 035 | _aMX001000556465 | ||
| 050 |
_aQC173.4S94 _bN38 1987 |
||
| 111 | 2 |
_aNato Advanced Study Institute On The Study Of Surfaces And Interfaces By Electron Optical Techniques _c(1987 : Erice, Italia) |
|
| 245 | 1 | 0 |
_aSurface and interface characterization by electron optical methods / _cEd. by a. howie and v. valdre |
| 264 | 1 |
_aNew York : _bPlenum, _cc1988 |
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| 300 | _aviii, 319 páginas | ||
| 490 | 0 |
_aNato asi series. series b, physics ; _vv. 191 |
|
| 500 | _a"proceedings of a nato advanced study institute on the study of surfaces and interfaces by electron optical techniques, held april 4-15, 1987, in erice, sicily, italia" -- rev. de la portada | ||
| 500 | _a"published in cooperation with nato scientific affairs division" | ||
| 650 |
_aSuperficies (Física) _xTécnica _vCongresos |
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| 650 |
_aMicroscopía electrónica _vCongresos |
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| 650 |
_aMicroscopía electrónica _xTransmisión _vCongresos |
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| 700 |
_aHowie, A., _eeditor |
||
| 700 |
_aValdre, Ugo, _eeditor |
||
| 710 | 2 |
_aOrganización del Tratado del Atlántico Norte. _bDivisión de Asuntos Científicos |
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| 336 |
_atexto _2rdacontent |
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| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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| 999 |
_c1504 _d1504 |
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