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|---|---|---|---|
| 005 | 20200318103744.0 | ||
| 008 | 100630s2010 xxua 000 0 eng d | ||
| 020 | _a9781606500415 | ||
| 020 | _a1606500414 | ||
| 035 | _aMX001001221522 | ||
| 040 |
_aUNAMX _bspa _cUNAMX _dUNAMX |
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| 050 | 4 |
_aQC611.8C64 _bC43 |
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_a621.3815/2 _220 |
| 245 | 0 | 0 |
_aCharacterization in compound semiconductor processing / _ceditors Yale Strausser and Gary E. McGuire |
| 264 | 1 |
_aNew York : _bMomentum, _cc2010 |
|
| 300 |
_a199 páginas : _bilustraciones |
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| 490 | 0 | _aMaterials characterization series | |
| 650 | 4 |
_aSemiconductores compuestos _xMateriales |
|
| 700 | 1 |
_aStrausser, Yale, _eeditor |
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| 700 | 1 |
_aMcGuire, G. E., _eeditor |
|
| 336 |
_atexto _2rdacontent |
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| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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_c2588 _d2588 |
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