000 | 01244nam a2200337zi 4500 | ||
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005 | 20200318103747.0 | ||
008 | 150610s2003 xxua 000 0 eng d | ||
020 | _a9780306472923 | ||
020 |
_a9781461349693 _qrústica |
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035 | _aMX001001768701 | ||
040 |
_aUNAMX _bspa _erda _cUNAMX _dUNAMX |
||
050 | 4 |
_aQH212.E9 _bS22 2003b |
|
100 | 1 |
_aGoldstein, Joseph, _dnacimiento 1939, _eautor |
|
245 | 1 | 0 |
_aScanning electron microscopy and X-ray microanalysis / _cJoseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, Joseph R. Michael |
250 | _aThird edition | ||
264 | 1 |
_a[New York] : _bSpringer, _c2003 |
|
300 |
_a690 páginas : _bilustraciones |
||
650 | 4 | _aMicroanálisis por rayos X | |
650 | 4 | _aMicroscopios electrónicos exploradores | |
700 | 1 |
_aNewbury, Dale E., _eautor |
|
700 | 1 |
_aEchlin, Patrick, _eautor |
|
700 | 1 |
_aJoy, David C., _eautor |
|
700 | 1 |
_aLyman, Charles E., _eautor |
|
700 | 1 |
_aLifshin, Eric, _eautor |
|
700 | 1 |
_aSawyer, Linda C., _d1944- _eautor |
|
700 | 1 |
_aMichael , Joseph R., _eautor |
|
336 |
_atexto _2rdacontent |
||
337 |
_asin medio _2rdamedia |
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338 |
_avolumen _2rdacarrier |
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999 |
_c2872 _d2872 |