000 | 01101nam a2200265zi 4500 | ||
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005 | 20200318103724.0 | ||
008 | 990116s1979 xxu 100 0 eng d | ||
020 | _a0895203588 | ||
035 | _aMX001000333135 | ||
040 |
_aUNAMX _bspa _erda _cUNAMX |
||
050 | 4 |
_aTA418.7 _bD37 |
|
100 | 1 |
_aDavis, L. E., _eautor |
|
245 | 1 | 0 |
_aModern surface analysis : _bmetallurgical applications of auger electron spectroscopy (aes) and x-ray photo electron spectroscopy (xps), las Vegas, Nevada, february 23-24, 1980 /L. E. Davis 1980 / _cedited by Ram Kossowsky and M. E. Glicksman |
264 | 1 |
_aWarrendale, Pa. : _bMetallurgical Society of AIME, _c[1979] |
|
300 | _a42 páginas | ||
500 | _aA la cabeza de la portada: "a tms-aime short course" | ||
500 | _aCurso auspiciado por "the tms-aime continuing education committee" | ||
650 | 4 |
_aSuperficies (TecnologĂa) _xPruebas _vCongresos |
|
700 | 1 |
_aKossowsky, Ram, _eeditor |
|
700 | 1 |
_aGlicksman, M. E., _eeditor |
|
336 |
_atexto _2rdacontent |
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337 |
_asin medio _2rdamedia |
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338 |
_avolumen _2rdacarrier |
||
999 |
_c820 _d820 |