Microscopic identification of electronic defects in semiconductors :
Microscopic identification of electronic defects in semiconductors : Symposium held april 15-18, 1985, san francisco, california, u.s.a. /
Eds. noble m. Johnson, Stephen g. bishop, George d. watkins
- xv, 604 páginas
- Materials Research Society symposia proceedings ; v. 46 .
0931837111
Semiconductores--Defectos--Congresos
Microscopía--Congresos
TK7871.85 / M525 1985
0931837111
Semiconductores--Defectos--Congresos
Microscopía--Congresos
TK7871.85 / M525 1985