The physics of SiO2 and its interfaces : proceedings of the international topical conference on the physics of SiO2 and its interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978 / editor, Sokrates T. Pantelides
Material type: TextPublisher: New York : Pergamon Press, c1978Description: 487 páginasContent type: texto Media type: sin medio Carrier type: volumenISBN: 0080230490Subject(s): Silico -- Congresos | Superficies (Física) -- Congresos | Química de superficies -- CongresosLOC classification: QC585.75S55 | I57 1978Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds |
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Libros | División de Estudios de Posgrado. Libros Libros | General | QC585.75S55 I57 1978 (Browse shelf(Opens below)) | 1 | Available | 4448 |
Total holds: 0
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