The physics of SiO2 and its interfaces : proceedings of the international topical conference on the physics of SiO2 and its interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978 / editor, Sokrates T. Pantelides
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|---|
![]() |
División de Estudios de Posgrado. Libros Libros | General | QC585.75S55 I57 1978 (Browse shelf(Opens below)) | 1 | Available | 4448 |
Total holds: 0
Browsing División de Estudios de Posgrado. Libros shelves, Shelving location: Libros, Collection: General Close shelf browser (Hides shelf browser)
No cover image available |
![]() |
![]() |
![]() |
![]() |
![]() |
![]() |
||
QC523 M36 1937 Foundations of technical electricity / | QC584.2 B67 1980 Theory of electric polarization / | QC584.2 B67 1980 Theory of electric polarization / | QC585.75S55 I57 1978 The physics of SiO2 and its interfaces : | QC596.5 L54 Principles and applications of ferroelectrics and related materials / | QC6.4 M64 1987 Fluctuation phenomena / | QC610.9 S64 The spectroscopy of semiconductors / |
There are no comments on this title.