Materials analysis ion channeling : Submicron crystallography / Leonard c. feldman, James w. mayer s.
Material type: TextPublisher: New York : Academic, 1982Description: 300 páginasContent type: texto Media type: sin medio Carrier type: volumenISBN: 0122526805Subject(s): Fasces ionicas | Cristalografía | Cristales -- Defectos | Sólidos -- Superficies | Canalización (Física)LOC classification: QC176.8C45 | F44Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds |
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Libros | División de Estudios de Posgrado. Libros Libros | General | QC176.8C45 F44 (Browse shelf(Opens below)) | 1 | Available | 4284 |
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QC176.82 I58 Solid films and surfaces : | QC176.82 I58 Solid films and surfaces : | QC176.858 S95 1987 Physics of solid surfaces 1987 : | QC176.8C45 F44 Materials analysis ion channeling : | QC176.8D5 M75 Defects and diffusion in solids : | QC176.8E35 D38 Waves, atoms and solids / | QC176.8E35 H48 The Kondo problem to heavy fermions |
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