Secondary ion mass spectrometry : Basic concepts, instrumental aspects, applications and trends / A. benninghoven, f.g. rudenauer, h.w. werner
Material type: TextSeries: Chemical analysis ; v. 86Publisher: New York : J. Wiley, c1987Description: 1227 páginasContent type: texto Media type: sin medio Carrier type: volumenISBN: 0471010561Subject(s): Espectrometría de masas de iones secundariosLOC classification: QD96.S43 | B45Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds |
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Libros | División de Estudios de Posgrado. Libros Libros | General | QD96.S43 B45 (Browse shelf(Opens below)) | 1 | Available | 12711 |
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QD96.R3 H36 Chemical applications of nonlinear raman spectroscopy / | QD96.R34 R363 Raman spectroscopy and applications / | QD96.R34 S74 Raman spectroscopy for catalysis / | QD96.S43 B45 Secondary ion mass spectrometry : | QD96.U4 C65 Computer methods in UV, visible and IR spectroscopy / | QD96.U4 U57 Ultraviolet spectroscopy and UV lasers | QD96.V52 H36 Symmetry and spectroscopy : |
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