Universidad Nacional Autónoma de México
Facultad de Química
Catálogo de la Biblioteca de Estudios de Posgrado

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Structural and chemical analysis of materials : X-ray, electron and neutron diffraction : X-ray, electron and ion spectrometry : Electron microscopy / J. p. eberhart ; translated by j. p. eberhart

By: Eberhart, Jean Pierre [autor]Material type: TextTextPublisher: Chichester : J. Wiley, c1991Description: 545 páginasContent type: texto Media type: sin medio Carrier type: volumenISBN: 0471929778Subject(s): Materiales -- Microscopía | MicroestructuraLOC classification: TA417.23 | E34
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Holdings
Item type Current library Collection Call number Copy number Status Date due Barcode Item holds
Libros Libros División de Estudios de Posgrado. Libros
Libros 		General TA417.23 E34 (Browse shelf(Opens below)) 1 Available 5204
Total holds: 0

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