Universidad Nacional Autónoma de México
Facultad de Química
Catálogo de la Biblioteca de Estudios de Posgrado

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Microscopic identification of electronic defects in semiconductors : Symposium held april 15-18, 1985, san francisco, california, u.s.a. / Eds. noble m. Johnson, Stephen g. bishop, George d. watkins

Contributor(s): Johnson, Noble M [editor] | Bishop, Stephen G [editor] | Watkins, George D [editor] | Materials Research SocietyMaterial type: TextTextSeries: Materials Research Society symposia proceedings ; v. 46Publisher: Pittsburgh, pennsylvania : Materials research society, c1985Description: xv, 604 páginasContent type: texto Media type: sin medio Carrier type: volumenISBN: 0931837111Subject(s): Semiconductores -- Defectos -- Congresos | Microscopía -- CongresosLOC classification: TK7871.85 | M525 1985
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Holdings
Item type Current library Collection Call number Copy number Status Date due Barcode Item holds
Libros Libros División de Estudios de Posgrado. Libros
Libros 		General TK7871.85 M525 1985 (Browse shelf(Opens below)) 1 Available 5962
Total holds: 0

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