Universidad Nacional Autónoma de México
Facultad de Química
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Introduction to optical metrology / Rajpal S. Sirohi

By: Sirohi, R. S [autor]Material type: TextTextSeries: Optical sciences and applications of lightPublisher: Boca Raton : CRC Press, Taylor & Francis Group, [2016]Copyright date: ©2016Description: xxvi, 423 páginas : ilustracionesContent type: texto Media type: sin medio Carrier type: volumenISBN: 9781482236101 (encuadernado : papel libre de ácido)Other title: Optical metrologySubject(s): Medidas ópticas | Metrología | Teoría ondulatoria de la luzDDC classification: 681/.25 LOC classification: QC367 | S55
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Item type Current library Collection Call number Copy number Status Date due Barcode Item holds
Libros Libros División de Estudios de Posgrado. Libros
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General QC367 S55 (Browse shelf(Opens below)) 1 Available 15093
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