Microscopic identification of electronic defects in semiconductors :  Symposium held april 15-18, 1985, san francisco, california, u.s.a. / 
Eds. noble m. Johnson, Stephen g. bishop, George d. watkins 
 - xv, 604 páginas 
 - Materials Research Society symposia proceedings ;  v. 46 .
<br/><br/><label>ISBN: </label>0931837111 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductores--Defectos--Congresos<br/>Microscopía--Congresos
<br/><br/><label>LC Class. No.: </label>TK7871.85  / M525 1985