TY  - BOOK
AU  - Johnson, Noble M.,
AU  - Bishop, Stephen G.,
AU  - Watkins, George D.
ED  - Materials Research Society
TI  - Microscopic identification of electronic defects in semiconductors: Symposium held april 15-18, 1985, san francisco, california, u.s.a. 
T2  - Materials Research Society symposia proceedings
SN  - 0931837111
AV  - TK7871.85 M525 1985
PY  - 1985///
CY  - Pittsburgh, pennsylvania
PB  - Materials research society
KW  - Semiconductores
KW  - Defectos
KW  - Congresos
KW  - Microscopía
ER  -