Determining nanoscale physical properties of materials by microscopy and spectroscopy :  symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A. / 
eds., Mehmet Sarikaya, H. Kumar Wickramasinghe, Michael Isaacson 
 - xiv, 622 páginas 
 - Materials Research Society symposium proceedings ;  v. 332 .
 - Materials Research Society symposium proceedings .
<br/><br/><label>ISBN: </label>1-55899-231-6 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanoestructuras--Analisis--Congresos<br/>Microscopia--Técnica--Congresos<br/>Espectroscopía--Congresos
<br/><br/><label>LC Class. No.: </label>QC176.8N35  / D47