Microscopic identification of electronic defects in semiconductors : Symposium held april 15-18, 1985, san francisco, california, u.s.a. / Eds. noble m. Johnson, Stephen g. bishop, George d. watkins
Material type: TextSeries: Materials Research Society symposia proceedings ; v. 46Publisher: Pittsburgh, pennsylvania : Materials research society, c1985Description: xv, 604 páginasContent type: texto Media type: sin medio Carrier type: volumenISBN: 0931837111Subject(s): Semiconductores -- Defectos -- Congresos | Microscopía -- CongresosLOC classification: TK7871.85 | M525 1985Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|---|
Libros | División de Estudios de Posgrado. Libros Libros | General | TK7871.85 M525 1985 (Browse shelf(Opens below)) | 1 | Available | 5962 |
Total holds: 0
There are no comments on this title.