Universidad Nacional Autónoma de México
Facultad de Química
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Secondary ion mass spectrometry : Basic concepts, instrumental aspects, applications and trends / A. benninghoven, f.g. rudenauer, h.w. werner

By: Benninghoven, A [autor]Contributor(s): Werner, H. W [autor] | Rudenauer, F.g [autor]Material type: TextTextSeries: Chemical analysis ; v. 86Publisher: New York : J. Wiley, c1987Description: 1227 páginasContent type: texto Media type: sin medio Carrier type: volumenISBN: 0471010561Subject(s): Espectrometría de masas de iones secundariosLOC classification: QD96.S43 | B45
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Item type Current library Collection Call number Copy number Status Date due Barcode Item holds
Libros Libros División de Estudios de Posgrado. Libros
Libros 		General QD96.S43 B45 (Browse shelf(Opens below)) 1 Available 12711
Total holds: 0

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