Characterization of defects in materials : Symposium held december 1-2, 1986, boston, massachusetts, usa / Eds. Richard w. siegel, Julia r. weertman, Robert Sinclair
Material type: TextSeries: Materials Research Society symposia proceedings ; v. 82Publisher: Pittsburgh, pennsylvania : Materials research society, c1987Description: xv, 532 páginasContent type: texto Media type: sin medio Carrier type: volumenISBN: 0931837472Subject(s): Materiales -- Defectos -- Congresos | Cristales -- Defectos -- CongresosLOC classification: TA418.5 | C42Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds |
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Libros | División de Estudios de Posgrado. Libros Libros | General | TA418.5 C42 (Browse shelf(Opens below)) | 1 | Available | 5960 |
Total holds: 0
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