| 000 | 01049nam a2200265zi 4500 | ||
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| 005 | 20200318115045.0 | ||
| 008 | 040830c1985ng0 13 | ||
| 020 | _a0931837111 | ||
| 035 | _aMX001000605335 | ||
| 050 |
_aTK7871.85 _bM525 1985 |
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| 245 | 0 | 0 |
_aMicroscopic identification of electronic defects in semiconductors : _bSymposium held april 15-18, 1985, san francisco, california, u.s.a. / _cEds. noble m. Johnson, Stephen g. bishop, George d. watkins |
| 264 | 1 |
_aPittsburgh, pennsylvania : _bMaterials research society, _cc1985 |
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| 300 | _axv, 604 páginas | ||
| 490 | 0 |
_aMaterials Research Society symposia proceedings ; _vv. 46 |
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| 650 |
_aSemiconductores _xDefectos _vCongresos |
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| 650 |
_aMicroscopía _vCongresos |
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| 700 |
_aJohnson, Noble M., _eeditor |
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| 700 |
_aBishop, Stephen G., _eeditor |
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| 700 |
_aWatkins, George D. _eeditor |
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| 710 | 2 | _aMaterials Research Society | |
| 336 |
_atexto _2rdacontent |
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| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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| 999 |
_c2627 _d2627 |
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